Amount of time data can be recorded with 1 GW memory.
DualCapture: A Powerful Tool for Durability Test Data Analysis
Simultaneous High-Speed and Low-Speed Recording Using DualCapture
During durability testing, it is necessary to monitor the long-term trends of your data as well as capture the high speed transients that might occur. This presents a challenge as trend data is usually recorded at a slower sampling speed that might miss the transient phenomena. To meet this challenge, the DL750 offers the DualCapture function.
DualCapture
Using DualCapture, you can now record your trend data with a slow sampling speed and still be able to capture the transient phenomena with a faster sampling speed.
- Integration of a High-Speed sampler (Oscilloscope) and Low-Speed sampler (Recorder) in a Single Unit
High-speed sampler: Trigger on abnormal high-speed phenomena
Low-speed in a sampler: Roll recording (trend recording)
- Separate Memory Management for Each sampler
Maximum memory for low-speed: 100 MW
Maximum memory for high-speed: 10 kW * 100 screens
- High-Speed Sampling Triggered Only by Abnormal Events Occurring during Long-Term Observation (Low-Speed Sampling)
Effective for separately capturing data at high speed
- Long Memory Equivalent to 1 Teraword (1012)
To acquire many hours of data at the higher sampling rate (10 MS/s) would require Teraword of memory:
(8 hr to 24 hr) × 60 min × 60 sec × 10 MS/s × 16 channels = 4.6 to 138 TW
